Surface characterization. C-V technique

Surface characterization. C-V technique

著者名:

掲載資料名:

Process and device modeling for integrated circuit design : [proceedings of the NATO Advanced Study Institute on Process and device modeling for integrated circuit design, Louvain-la-Neuve, Belgium, July 19-29, 1977]

シリーズ名:

NATO ASI series. Series E, Applied sciences

シリーズ巻号:

21

発行年:

1977

開始ページ:

589

終了ページ:

608

総ページ数:

20

出版情報:

Leyden: Noordhoff International Publishing

ISSN:

0168132X

ISBN:

9789028606678 [902860667X]

言語:

英語

請求記号:

N11482/21

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00017296
シリーズID:	PA00000018
会議名:	NATO Advanced Study Institute on Process and device modeling for integrated circuit design
回次:	1977
会議開催地:	Louvain-la-Neuve, Belgium
会議開催年:	1977.07.19-1977.07.29

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