Sensitivity of the ellipsometric angles psi and delta to the surface inhomogeneity

Sensitivity of the ellipsometric angles psi and delta to the surface inhomogeneity

著者名:

掲載資料名:

Advances in Optical Interference Coatings : 25-27 May 1999, Berlin, Germany

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

3738

発行年:

1999

開始ページ:

173

終了ページ:

182

出版情報:

Bellingham, WA: SPIE - The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819432124 [0819432121]

言語:

英語

請求記号:

P63600/3738

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00017152
シリーズID:	PA00000029
会議名:	SPIE Optical Systems Design : Advances in Optical Interference Coatings
回次:	1999
会議開催地:	Berlin, Germany
会議開催年:	1999.05.25-1999.05.27

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