Blank Cover Image

Electrical Properties of Semiconducting CuGa0.5In0.5Se2 Thin Films

著者名:
掲載資料名:
Proceedings of the Tenth International Workshop on the Physics of Semiconductor Devices (December 14-18, 1999)
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3975
発行年:
2000
巻:
Part2
開始ページ:
1473
終了ページ:
1475
出版情報:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819436016 [0819436011]
言語:
英語
請求記号:
P63600/3975
資料種別:
国際会議録

類似資料:

1 国際会議録 X-ray Investigations of Ga2+xTe3-x Semiconducting Alloys

Singh,D.P., Dhawan,U., Pant,R.P., Rashmi, Suri,D.K.

SPIE-The International Society for Optical Engineering, Narosa
7 国際会議録 Electrical Properties of Annealed La0.5Sr0.5MnO3-d Thin Films Prepared by Pulsed Laser Deposition

Quenneville, F., Decorse, P., Meunier, M., Morin, F., Yelon, A.

Electrochemical Society
2 国際会議録 Single Crystal Precession Study of Ga2Te3 Chalcogenide

Singh,D.P., Pant,R.P., Suri,D.K.

SPIE - The International Society for Optical Engineering
8 国際会議録 Characterization of Sintered Cd0.5Zn0.5Se Films

Singh,Beer Pal, Singh,Virendra, Kaushish,Sanjeev K., Kumar,Vinod, Singh,Gulbeer, Sharma,T.P.

SPIE - The International Society for Optical Engineering
3 国際会議録 Growth and Characterization of Ga2Te5and its Solid-Solution

Singh, D.P., Suri, D.K., Sood, K.N.

SPIE-The International Society for Optical Engineering
9 国際会議録 CORRELATION OF THE STRESS-TEMPERATURE HISTORY WITH MICROSTRUCTURE IN Al-0.5Cu AND Al-0.15Pd THIN FILMS

Knorr, D. D., Rodbell, K. P.

MRS - Materials Research Society
4 国際会議録 Influence of Ta2O5, TiO2, and ZrO2 Interfacial Layers on Structural and Electrical Properties of Laser Ablated Ba0.5Sr0.5TiO3 Thin Films

Das, Suprem R., Das, Rasmi R., Bhattacharya, P., Katiyar, Ram S.

Materials Research Society
10 国際会議録 Improved Dielectric Properties of Heterostructured Ba0.5Sr0.5TiO3 Thin Film Composites for Microwave Dielectric Devices

Jain, M., Majumder, S. B., Katiyar, R. S., Bhalla, A. S., Agrawal, D. C., Van Keuls, F. W., Miranda, F. A., Romanofsky, …

Materials Research Society
5 国際会議録 Characterization, Electrical Properties, and Interface Engineering of Sputtered Ba0.5Sr0.5 TiO3 Thin Films for DRAM Applications

Chu, P., Zafar, S., Kottke, M., Remmel, T., Melnick, B., Jones, R.E., Jr.

Electrochemical Society
11 国際会議録 GROWTH AND CHARACTERIZATION OF Ba0.5Sr0.5TiO3 THIN FILMS ON Si (100) BY 90｡? OFF-AXIS SPUTTERING

Hou, S. Y., Kwo, J., Watts, R. K., Werder, D. J., Shmulovich, J., O'Bryan, H. M.

MRS - Materials Research Society
6 国際会議録 Structural and Electrical Properties of Ba0.5Sr0.5TiO3 Thin Films for Tunable Microwave Applications

Manavalan, Sriraj G., Kumar, Ashok, Weller, T., Sikder, A.K.

Materials Research Society
12 国際会議録 Vacancy Related Defects in La0.5Sr0.5CoO3-ｦﾄ Thin Films

Keeble, D. J., Madhukar, S., Nielsen, B., Krishnan, A., Asoka-Kumar, P., Aggarwal, S., Ramesh, R., Poindexter, E. H.

MRS - Materials Research Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12