Studies on Minority-Carrier Lifetime by Microwave Photoconductivity Decay Technique

Studies on Minority-Carrier Lifetime by Microwave Photoconductivity Decay Technique

著者名:

掲載資料名:

Proceedings of the Tenth International Workshop on the Physics of Semiconductor Devices (December 14-18, 1999)

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

3975

発行年:

2000

巻:

Part2

開始ページ:

1365

終了ページ:

1368

出版情報:

Bellingham, Wash.: SPIE - The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819436016 [0819436011]

言語:

英語

請求記号:

P63600/3975

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00017117
シリーズID:	PA00000029
会議名:	International Workshop on the Physics of Semiconductor Devices
回次:	1999 : 10th
会議開催地:	Delhi, India
会議開催年:	1999.12.14-1999.12.18

類似資料:

1 国際会議録 Minority Carrier Lifetime Measurements in 6H-SiC Using the Photoconductive Decay Technique Zhou,W., Khlebnikov,I., Sudarshan,T.S., Capano,M.A., Mitchel,W.C. Trans Tech Publications	7 国際会議録 Excess Carrier Lifetimes in a Bulk p-Type SiC Wafer Measured by the Microwave Photoconductivity Decay Method M. Kawai, T. Mori, M. Kato, M. Ichimura, S. Sumie, H. Hashizume Trans Tech Publications
2 国際会議録 Minority Carrier Lifetime Measurements in Specific Epitaxial 4H-SiC Layers by the Microwave Photoconductivity Decay L. Ottaviani, O. Palais, D. Barakel, M. Pasquinelli Trans Tech Publications	8 国際会議録 Excess Carrier Lifetime Measurements for GaN on Sapphire Substrates with Various Doping Concentrations and Surface Conditions by the Microwave Photoconductivity … Kato, Masashi, Watanabe, Hideki, Ichimura, Masaya, Arai, Eisuke Materials Research Society
3 国際会議録 Minority Carrier Lifetime in Silicon Solar Cells by Short Circuit Current Decay Technique Subramanian,V., Subrahmanyan,A., Murthy,V.R.K. SPIE - The International Society for Optical Engineering	9 国際会議録 Excess Carrier Lifetime Mapping for Bulk SiC Wafers by Microwave Photoconductivity Decay Method and Its Relationship with Structural Defect Distribution Kato, M., Ichimura, M., Arai, E., Sumie, S., Hashizume, H. Trans Tech Publications
4 国際会議録 Sensitivity Analysis of 94 GHz Dual-Window PIN Array Switch Gupta,A.K., Ray,U.C. Narosa Publishing House	10 国際会議録 New surface minority carrier lifetime measurement technique W. Goldfarb Society of Photo-optical Instrumentation Engineers
5 国際会議録 Steady-state and Time-resolved Photoconductivity Measurements of Minority Carrier Lifetime in ZnTe Bose,D.N., Johnston,S., Ahrenkiel,R.K., Bhunia,S. SPIE - The International Society for Optical Engineering	11 国際会議録 Measure of Carrier Lifetime in Nanocrystalline Silicon Thin Films Using Transmission Modulated Photoconductive Decay Brian J. Simonds, Baojie Yan, Guozhen Yue, Donald J. Dunlavy, Richard K. Ahrenkiel, P. Craig Taylor Materials Research Society
6 国際会議録 Carrier Lifetime Analysis by Microwave Photoconductive Decay (μ-PCD) for 4H SiC Epitaxial Wafers G.Y. Chung, M.J. Loboda, M.F. MacMillan, J.W. Wan, D.M. Hansen Trans Tech Publications	12 国際会議録 Hg1-xCdxTe LWIR Photoconductive Linear Array Detector Fabrication Process Control Through Lifetime Monitoring Sharma,B.L., Arora,P.K.Bedi S.C., Shreeniwas, Chaudhary,P.K., Pal,R., Gupta,A.K., Singh,R., Basu,P.K., Gopal,V. SPIE - The International Society for Optical Engineering

1

2

3

4

5

6

7

8

9

10

11

12