Blank Cover Image

Hybrid and CMOS-Based Infrared Detectors

著者名:
Merken,P.
Moor,P.De
John,J.
Zimmermann,L.
Gastal,M.
Jain,S.C.
Hoof,C.Van
さらに 2 件
掲載資料名:
Proceedings of the Tenth International Workshop on the Physics of Semiconductor Devices (December 14-18, 1999)
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3975
発行年:
2000
巻:
Part1
開始ページ:
19
終了ページ:
25
出版情報:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819436016 [0819436011]
言語:
英語
請求記号:
P63600/3975
資料種別:
国際会議録

類似資料:

Hoof,C.A.Van, Zimmermann,L., John,J., Moor,P.De, Kavadias,S., Gastal,M., Nemeth,S., Borghs,G., Merken,P.

SPIE-The International Society for Optical Engineering

Kavadias,S., Moor,P.De, Gastal,M., Hendrikx,N., Wirix,F., Hoof,C.A.Van

SPIE-The International Society for Optical Engineering

Merken,P., Zimmermann,L., John,J., Nemeth,S., Gastal,M., Borghs,G., Hoof,C.A.Van

SPIE - The International Society for Optical Engineering

John, J., Zimmermann, L., De Moor, P., De Munck, K., Borgers, T., Van Hoof, C.

SPIE - The International Society of Optical Engineering

Zimmermann,L., John,J., Weerd,M.de, Slaman,M., Nemeth,S., Merken,P., Borghs,S., Hoof,C.A.Van

SPIE-The International Society for Optical Engineering

Merken P., Souverijns T., Putzeys J., Creten Y., Van Hoof C.

SPIE - The International Society of Optical Engineering

John,J., Zimmermann,L., Nemeth,S., Colin,T., Merken,P., Borghs,S., Hoof,C.A.Van

SPIE-The International Society for Optical Engineering

Merken, P., Creten, Y., Putzeys, J., Souverijns, T., Hoof, C. Van

SPIE - The International Society of Optical Engineering

John, J., Zimmermann, L., Merken, P., Borghs, G., Van Hoof, C.A., Nemeth, S.

SPIE-The International Society for Optical Engineering

11 国際会議録 SNAP near infrared detectors

Tarle, G., Akerlof, C.W., Aldering, G., Amanullah, R., Astier, P., Barrelet, E., Bebek, C., Bergstroen, L., Bercovitz, …

SPIE-The International Society for Optical Engineering

John, J., Zimmermann, L., Merken, P., de Groote, S., Borghs, G., Van Hoof, C., Nemeth, S., Colin, T.

SPIE-The International Society for Optical Engineering

Kraft,S., Merken,P., Creten,Y., Putzeys,J., Hoof,C.A.Van, Katterloher,R.O., Rosenthal,D., Rumitz,M., Grozinger,U., …

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12