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3-D measurement of deformation microstructure in Al(0.2%)Mg using submicron resolution white X-ray microbeams

著者名:
Larson, B. C.
Tamura, N.
Chung, J-S.
Ice, G. E.
Budai, J. D.
Tischler, J. Z.
Yang, W.
Weiland, H.
Lowe, W. P.
さらに 4 件
掲載資料名:
Applications of synchrotron radiation techniques to materials science V : sympoisum held November 29-December 3, 1999, Boston, Massachusetts, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
590
発行年:
2000
開始ページ:
247
出版情報:
Warrendale, Pa.: MRS-Materials Research Society
ISSN:
02729172
ISBN:
9781558994980 [155899498X]
言語:
英語
請求記号:
M23500/590
資料種別:
国際会議録

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