Blank Cover Image

Investigation of inhomogeneous in-plane strain relaxation in Si/SiGe quantum wires by high resolution X-ray diffraction

著者名:
Zhuang, Y.
Schelling, C.
Roch, T.
Daniel, A.
Schaffler, F.
Bauer, G.
Grenzer, J.
Pietsch, U.
Senz, S.
さらに 4 件
掲載資料名:
Applications of synchrotron radiation techniques to materials science V : sympoisum held November 29-December 3, 1999, Boston, Massachusetts, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
590
発行年:
2000
開始ページ:
207
出版情報:
Warrendale, Pa.: MRS-Materials Research Society
ISSN:
02729172
ISBN:
9781558994980 [155899498X]
言語:
英語
請求記号:
M23500/590
資料種別:
国際会議録

類似資料:

1 国際会議録 Strain compensated Si/SiGe quantum cascade emitters grown on SiGe pseudosubstrates

Diehl, L., Mentese, S., Sigg, H., Muller, E., Grutzmacher, D., Gennser, U., Sagnes, I., Fromherz, T., Stangl, J., Roch, …

Kluwer Academic Publishers
7 国際会議録 Fabrication and X-Ray Diffractometry Investigation of CdTe/MnTe Multiple Quantum Wires

Darhuber,A.A., Straub,H., Ferreira,S.O., Faschinger,W., Sitter,H., Koppensteiner,E., Brunthaler,G., Bauer,G.

Trans Tech Publications
2 国際会議録 The application of high resolution X-ray diffraction for the investigation of the process of elastic strain relaxation in InGaAs quantum well

Faleev,N., Stabenow,R., Sinitsyn,M., Yavich,B., Haase,A., Grudsky,A.

Trans Tech Publications
8 国際会議録 X-ray diffraction analysis of self-organized InAs quantum dots

Zhuang,Y., Wang,Y.T., Ma,W.Q., Wang,W., Yang,X.P., Chen,Z.G., Jiang,D.S., Zheng,H.Z.

SPIE-The International Society for Optical Engineering
3 国際会議録 STRAIN RELAXATION IN EPITAXIAL HETEROSTRUCTURES: SENSITIVITY OF HIGH RESOLUTION X-RAY DIFFRACTION

Goorsky, M.S., Horng, S.T., Stiffler, S.R., Stanis, C.S.

Materials Research Society
9 国際会議録 E7 - New Strain Scanner at HMI - High Q-Resolution for Phase-Sensitive Analysis of Stress Distributions

Henkel, F., Hermeking-Goebel, U., Lemke, P., Wilpert, T., Pietsch, C., Schneider, R.

Trans Tech Publications
4 国際会議録 Investigation of SiGe/Si - Heterostructures with High Resolution X-Ray Diffraction Methods

Frohberg, K., Wehner, B., Trui, B., Wolf, K., Paufler, P., Kuck, H.

Trans Tech Publications
10 国際会議録 X-RAY STUDY OF NON-PERIODIC Si/SiGe MULTILAYERS

Herzog, H.-J., Kibbel, H., Schaffler, F.

Materials Research Society
5 国際会議録 Grazing-Incidence X-ray Diffraction Studies of the Relaxation Behavior in GaInAs/GaAs Multilayers Grown on GaAs(001)

Rose, Dirk, Pietsch, Ullrich

MRS - Materials Research Society
11 国際会議録 HIGH-RESOLUTION X-RAY DIFFRACTION MEASUREMENTS OF SiGe/Si STRUCTURES

Jordan-Sweet, J. L., Mooney, P. M., Stephenson, G. B.

MRS - Materials Research Society
6 国際会議録 MODULATION DOPED Si/SiGe HETEROSTRUCTURES

Schaffler, F.

Materials Research Society
12 国際会議録 Strain induced compositional modulations in AlGaAs overlayers induced by lateral surface gratings

Pietsch, Y., Zeimer, U., Hofmann, L., Grenzer, H., Gramlich, S.

MRS-Materials Research Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12