Stephen A. Guzikowski, M.G. Ierapetritou, C.M. Roth
American Institute of Chemical Engineers
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Moser,J.G., Ruebner,A., Weitemeyer,A., Michelsen,U., Wohrle,D., Ruck,A.C., StrauB,W.S., Kirsch,D., Andrees,S., …
SPIE-The International Society for Optical Engineering
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Coruzzi M. G., Edwards W. J., Walker L. E., Tsai -Y. F., Brears T.
Plenum Press
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Borkakoti N., Winkler K. F., Williams H. D., D'Arcy A., Bottomley K., Bradshaw D., Broadhurst J. M., Brown A. P., Hill …
Kluwer Academic Publishers
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Schmidt G. F. M., Schmidt M.
Springer-Verlag
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Richard, F., Drouillard, J., Carreyre, H., Lemberton, J. L., Perot, G.
Elsevier
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Goede, A. T. J. W. de, Oosterom, M. van, Deurzen, M. P. J., Sheldon, R. A., Bekkum, H. van, Rantwijk, F. van
Elsevier
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Jourdan, F., Melancon, G.
SPIE-The International Society for Optical Engineering
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van Bekkum, H., Hoefnagel, A. J., van Koten, M. A., Gunnewegh, E. A., Vogt, A. H. G., Kouwenhoven, H. W.
Elsevier
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Klier,K., Sun, Q., Feeley, O. C., Johansson, M., Herman, R. G.
Elsevier
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Cron, M. J., Keil, J. G., Lin, J. S., Ruggeri, M. V., Walker, D.
American Chemical Society
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Kisenyi, J., Soe, K., Leason, P., Tooby, C., Pritchett, D., Morgan, G., Zillikens, M.
Elsevier
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