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Characterization of growth defects in ZnTe single Crystals

著者名:
Zhou, W.
Wu, J.
Dudley, M.
Su, C. H.
Volz, M. P.
Gillies, D. C.
Szofran, F. R.
Lehoczky, S. L.
さらに 3 件
掲載資料名:
Semiconductors for room-temperature radiation detector applications : symposium held April 12-16, 1993, San Francisco, California, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
302
発行年:
1993
開始ページ:
451
出版情報:
Pittsburgh, Pa.: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558991989 [1558991980]
言語:
英語
請求記号:
M23500/302
資料種別:
国際会議録

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