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Quality of bulk CdTe substrates and its relation to intrinsic defects

著者名:
Meyer, B. K.
Hofmann, D. M.
Stadler, W.
Emanuelsson, P.
Omling, P.
Weigel, E.
Muller-Vogt, G.
Wienecke, F.
Schenk, M.
さらに 4 件
掲載資料名:
Semiconductors for room-temperature radiation detector applications : symposium held April 12-16, 1993, San Francisco, California, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
302
発行年:
1993
開始ページ:
433
出版情報:
Pittsburgh, Pa.: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558991989 [1558991980]
言語:
英語
請求記号:
M23500/302
資料種別:
国際会議録

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