Investigation of deep levels in X-ray detector material with Photo Induced Current Transient Spectroscopy (PICTS)

Investigation of deep levels in X-ray detector material with Photo Induced Current Transient Spectroscopy (PICTS)

著者名:

Eiche, C.

掲載資料名:

Semiconductors for room-temperature radiation detector applications : symposium held April 12-16, 1993, San Francisco, California, U.S.A.

シリーズ名:

Materials Research Society symposium proceedings

シリーズ巻号:

302

発行年:

1993

開始ページ:

231

出版情報:

Pittsburgh, Pa.: MRS - Materials Research Society

ISSN:

02729172

ISBN:

9781558991989 [1558991980]

言語:

英語

請求記号:

M23500/302

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00017068
シリーズID:	PA00000011
会議名:	Symposium on semiconductors for room-temperature radiation detector applications
回次:	1993
会議開催地:	San Francisco, CA, USA
会議開催年:	1993.04.12-1993.04.16

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