UHV-Investigation on MOCVD-Grown InP(100) Surfaces
- 著者名:
Visbeck, S. Hannappel, T. Vogt, P. Mahrt, J. Zorn, M. Knorr, K. Neges, M. Esser, N. Richter, W. Willig, F. - 掲載資料名:
- Epitaxial growth - principles and applications : symposium held April 5-8, 1999, San Francisco, California, U.S.A.
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 570
- 発行年:
- 1999
- 開始ページ:
- 67
- 出版情報:
- Warrendale, PA: MRS - Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558994775 [1558994777]
- 言語:
- 英語
- 請求記号:
- M23500/570
- 資料種別:
- 国際会議録
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In- Situ Characterization of Epitaxial Semiconductor Growth by Reflectance Anisotropy Spectroscopy
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P-H bonds in the reconstruction of P-rich InP(100) measured with FTIR (Invited Paper) [6325-21]
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