Control of Grain Size of Pb(Zr,Ti)O3 Thin Films by MOCVD and the Effect of Size on the Electrical Properties

Control of Grain Size of Pb(Zr,Ti)O3 Thin Films by MOCVD and the Effect of Size on the Electrical Properties

著者名:

掲載資料名:

Ferroelectric thin films VII : symposium held November 30-December 3, 1998, Boston, Massachusetts, U.S.A.

シリーズ名:

Materials Research Society symposium proceedings

シリーズ巻号:

541

発行年:

1999

開始ページ:

327

出版情報:

Warrendale, PA: MRS - Materials Research Society

ISSN:

02729172

ISBN:

9781558994478 [1558994475]

言語:

英語

請求記号:

M23500/541

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00017065
シリーズID:	PA00000011
会議名:	Symposium on ferroelectric thin films
回次:	7th
会議開催地:	Boston, MA, USA
会議開催年:	1998.11.30-1998.12.03

類似資料:

1 国際会議録 Effects of the Purity of Metalorganic Sources on the Electrical Properties of Pb(Zr,Ti)O3 Thin Films by MOCVD Shimizu, M., Yoshida, M., Fujisawa, H., Niu, H. MRS - Materials Research Society	7 国際会議録 Observation of domain structure at initial growth state of PbTiO3 thin films grown by MOCVD Fujisawa, H., Shimizu, M., Niu, H., Honda, K., Ohtani, S. MRS-Materials Research Society
2 国際会議録 Step Coverage of Pb(Zr,Ti)O3 Thin Films Grown by MOCVD Shimizu, M., Hyodo, S., Fujisawa, H., Niu, H., Shiosaki, T. MRS - Materials Research Society	8 国際会議録 Piezoresponse Measurements for Pb(Zr,Ti)O3 Island Structure Using Scanning Probe Microscopy Fujisawa, H., Morimoto, K., Shimizu, M., Niu, H., Honda, K., Ohtani, S. Materials Research Society
3 国際会議録 Investigation of Domain Wall Velocity and Nucleation Rate in Polarization Switching of Epitaxial Pb(Zr,Ti)O3 Thin Films Using Piezoresponse Scanning Force … Fujisawa, H., Yagi, T., Shimizu, M., Niu, H. Materials Research Society	9 国際会議録 Ir Thin Films for PZT Capacitors Prepared by MOCVD Using a New Ir Precursor Fujisawa, H., Watari, S., Shimizu, M., Niu, H., Oshima, N. Materials Research Society
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