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Studies of Metallic Species Incorporation During Growth of SrBi2Ta2O9 Films on YBa2Cu3O7-x Substrates Using Mass Spectroscopy of Recoiled Ions

著者名:
Dhote, A. M.
Krauss, A. R.
Auciello, O.
Im, J.
Gruen, D. M.
Ramesh, R.
Pai, S. P.
Venkatesan, T.
さらに 3 件
掲載資料名:
Ferroelectric thin films VII : symposium held November 30-December 3, 1998, Boston, Massachusetts, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
541
発行年:
1999
開始ページ:
281
出版情報:
Warrendale, PA: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558994478 [1558994475]
言語:
英語
請求記号:
M23500/541
資料種別:
国際会議録

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