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Microstructural and Electrical Characterization of Misfit Dislocations at the InAs/GaP Heterointerface

著者名:
掲載資料名:
Electrically based microstructural characterization II : symposium held December 1-4, 1997, Boston, Massachusetts, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
500
発行年:
1998
開始ページ:
63
出版情報:
Warrendale, PA: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558994058 [155899405X]
言語:
英語
請求記号:
M23500/500
資料種別:
国際会議録

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