Formation of Dislocations in NiAl Single Crystals Studied by In Situ Electrical Resistivity Measurement

Formation of Dislocations in NiAl Single Crystals Studied by In Situ Electrical Resistivity Measurement

著者名:

掲載資料名:

Electrically based microstructural characterization II : symposium held December 1-4, 1997, Boston, Massachusetts, U.S.A.

シリーズ名:

Materials Research Society symposium proceedings

シリーズ巻号:

500

発行年:

1998

開始ページ:

49

出版情報:

Warrendale, PA: MRS - Materials Research Society

ISSN:

02729172

ISBN:

9781558994058 [155899405X]

言語:

英語

請求記号:

M23500/500

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00017061
シリーズID:	PA00000011
会議名:	Symposium on electrically based microstructural characterization
回次:	2nd
会議開催地:	Boston, MA, USA
会議開催年:	1997.12.01-1997.12.04

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