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Focused-Ion-Beam Milling and Micromanipulation Lift-Out for Site-Specific-Cross-Section TEM Specimen Preparation

著者名:
掲載資料名:
Specimen preparation for transmission electron microscopy of materials IV : symposium held April 2, 1997, San Francisco, California, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
480
発行年:
1997
開始ページ:
19
出版情報:
Pittsburgh, Pa.: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558993846 [1558993843]
言語:
英語
請求記号:
M23500/480
資料種別:
国際会議録

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