Cathodoluminescence Spectroscopy for Evaluation of Defect Passivation in GaSb
- 著者名:
Pal, U. Piqueras, J. Dutta, P. S. Bhat, H. L. Dubey, G. C. Kumar, Vikram Dieguez, E. - 掲載資料名:
- Diagnostic techniques for semiconductor materials processing II : symposium held November 27-30, 1995, Boston, Massachusetts, U.S.A.
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 406
- 発行年:
- 1996
- 開始ページ:
- 537
- 出版情報:
- Pittsburgh, Pa.: MRS - Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558993099 [1558993096]
- 言語:
- 英語
- 請求記号:
- M23500/406
- 資料種別:
- 国際会議録
類似資料:
MRS - Materials Research Society |
Narosa Publishing House |
MRS - Materials Research Society |
Trans Tech Publications |
MRS-Materials Research Society |
MRS - Materials Research Society |
4
国際会議録
Surface and Bulk Passivation Studies in Gallium Antimonide:An Emerging Optoelectronic Materials
SPIE-The International Society for Optical Engineering, Narosa |
MRS - Materials Research Society |
MRS - Materials Research Society |
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering, Narosa |
MRS - Materials Research Society |