X-RAY MEASUREMENTS OF DEFORMATIONS IN FILMS AND SUBSTRATES IN HETEROEPITAXIAL SYSTEM GaAs/Ge

X-RAY MEASUREMENTS OF DEFORMATIONS IN FILMS AND SUBSTRATES IN HETEROEPITAXIAL SYSTEM GaAs/Ge

著者名:

掲載資料名:

Thin films, stresses and mechanical properties V : symposium held November 28-December 2, 1994, Boston, Massachusetts, U.S.A.

シリーズ名:

Materials Research Society symposium proceedings

シリーズ巻号:

356

発行年:

1995

開始ページ:

313

出版情報:

Pittsburgh, Pa.: MRS - Materials Research Society

ISSN:

02729172

ISBN:

9781558992573 [155899257X]

言語:

英語

請求記号:

M23500/356

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00017048
シリーズID:	PA00000011
会議名:	Symposium on thin films
回次:	5th
会議開催地:	Boston, MA, USA
会議開催年:	1994.11.28-1994.12.02

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