GRAZING INCIDENCE X-RAY REFLECTANCE MEASUREMENT OF SURFACE AND INTERFACE ROUGHNESS ON THE SUB-NANOMETRE SCALE

GRAZING INCIDENCE X-RAY REFLECTANCE MEASUREMENT OF SURFACE AND INTERFACE ROUGHNESS ON THE SUB-NANOMETRE SCALE

著者名:

掲載資料名:

Determining nanoscale physical properties of materials by microscopy and spectroscopy

シリーズ名:

Materials Research Society symposium proceedings

シリーズ巻号:

332

発行年:

1994

開始ページ:

525

出版情報:

Pittsburgh, Pa.: MRS - Materials Research Society

ISSN:

02729172

ISBN:

9781558992313 [1558992316]

言語:

英語

請求記号:

M23500/332

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00017046
シリーズID:	PA00000011
会議名:	Symposium on determining nanoscale physical properties of materials by microscopy and spectroscopy
回次:	1993
会議開催地:	Boston, Massachusetts, USA
会議開催年:	1993.11.29-1993.12.03

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