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LOW VOLTAGE POINT PROJECTION MICROSCOPY AND TIME OF FLIGHT STM-TWO NEW MICROSCOPIES

著者名:
Spence, J. C. H.
Qian, W.
Lo, W.
Mo, S.
Knipping, U.
Zhang, X.
さらに 1 件
掲載資料名:
Determining nanoscale physical properties of materials by microscopy and spectroscopy
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
332
発行年:
1994
開始ページ:
405
出版情報:
Pittsburgh, Pa.: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558992313 [1558992316]
言語:
英語
請求記号:
M23500/332
資料種別:
国際会議録

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