Blank Cover Image

Quantum mechanical characterization of the microscopic structure and nonlinear optical properties of radiation-induced defects in a-SiO2

著者名:
掲載資料名:
Photonics for space environments IV : 6-7 August 1996, Denver, Colorado
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
2811
発行年:
1996
開始ページ:
61
終了ページ:
65
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819421999 [0819421995]
言語:
英語
請求記号:
P63600/2811
資料種別:
国際会議録

類似資料:

1 国際会議録 A Quantum Mechanical Investigation of Positively Charged Defects in SiO2 Thin-Film Devices

Ferreira, Antonio M., Karna, Shashi P., Brothers, Charles P., Pugh, Robert D., Singaraju, Babu B. K., Vanheusden, Karel, …

MRS - Materials Research Society
7 国際会議録 A Combined Hartree-Fock and Local-Density-Functional Method To Calculate Linear and Nonlinear Optical Properties of Molecules

Dunlap, Brett I., Karna, Shashi P.

American Chemical Society
2 国際会議録 Point defects in Si-SiO2 systems: current understanding

Karna, S.P., Kurtz, H.A., Pineda, A.C., Shedd, W.M., Pugh, R.D.

Kluwer Academic Publishers
8 国際会議録 Effects of MeV Si Ions Modification on the Thermoelectric Properties of SiO₂/SiO₂+Cu Multilayer Thin Films

J. Chacha, S. Budak, C. Smith, M. Pugh, K. Ogbara, K. Heidary, R.B. Johnson, C. Muntele, D. ILA

Materials Research Society
3 国際会議録 First-principles quantum mechanical characterization of structure and NLO properties of Li+@C60

S.P. Karna, W.J. Lauderdale, B.I. Dunlap, J.L. Ballester

Society of Photo-optical Instrumentation Engineers
9 国際会議録 Thermoelectric Properties of SiO₂/SiO₂+CoSb₃Multi Nanolayered Films Modified by MeV Si Ions Bombardment

S. Budak, C. Smith, J. Chacha, M. Pugh, K. Ogbara, K. Heidary, R.B. Johnson, C. Muntele, D. ILA

Materials Research Society
4 国際会議録 Template based nanofabrication: mechanical characterization of film-substrate interface [5852- 151]

Das, B., Singaraju, P.

SPIE - The International Society of Optical Engineering
10 国際会議録 Thermoelectric Properties of SiO₂/SiO₂+Ag Nanolayered Multilayer Films Effected by MeV Si Ions

S. Budak, C. Smith, J. Chacha, M. Pugh, H. Martin, T. Langham, B. Harrell, K. Heidary, R.B. Johnson, Y. Yang, C. …

Materials Research Society
5 国際会議録 Electronic Structure Studies of the E primed and the Thplet-State Centers in a-Si02

Karna, S, Pineda, A, Shedd, W, Singaraju, B K

Electrochemical Society
11 国際会議録 Characterization of Cu-Al Alloy/SiO2 Interface Microstructure

Wang, P.-I., Murarka, S.P., Yang, G.-R., Barnat, E., Lu, T.-M., Chen, Y.-C., Li, X., Ranjan, K.

Materials Research Society
6 国際会議録 Size-Dependence of the Linear and Nonlinear Optical Properties of GaN Nanoclusters

Pineda, Andrew C., Karna, Shashi P.

Materials Research Society
12 国際会議録 DRAWING-OR RADIATION-INDUCED PARAMAGNETIC DEFECTS ASSOCIATED WITH Ge IN SiO2:GeO359 OPTICAL FIBER

Kawazoe, H., Watanabe, Y., Shibuya, K, Muta, K.

Materials Research Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12