Spectroscopic investigation of near-surface and surface quantum well structures of semiconductors
- 著者名:
- Shen,S.C. ( Shanghai Institute of Technical Physics (China) and Ctr. for Advanced Studies in Science and Technology of Microstructures (China) )
- Chen,X. ( Shanghai Institute of Technical Physics (China) and Ctr. for Advanced Studies in Science and Technology of Microstructures (China) )
- Lu,W. ( Shanghai Institute of Technical Physics (China) and Ctr. for Advanced Studies in Science and Technology of Microstructures (China) )
- Wan,M. ( Shanghai Institute of Technical Physics (China) and Ctr. for Advanced Studies in Science and Technology of Microstructures (China) )
- Liu,X. ( Shanghai Institute of Technical Physics (China) and Ctr. for Advanced Studies in Science and Technology of Microstructures (China) )
- 掲載資料名:
- Third International Conference on Thin Film Physics and Applications : 15-17 April 1997, Shanghai, China
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 3175
- 発行年:
- 1998
- 開始ページ:
- 2
- 終了ページ:
- 8
- 出版情報:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819426734 [0819426733]
- 言語:
- 英語
- 請求記号:
- P63600/3175
- 資料種別:
- 国際会議録
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