Challenges of adapting a dual-wavelength infrared imaging system as an industrial inspection tool

Challenges of adapting a dual-wavelength infrared imaging system as an industrial inspection tool

著者名:

Shabestari,B.N. ( Edison Industrial Systems Ctr. )
Kourous,H.E. ( Edison Industrial Systems Ctr. )
Luster,S.D. ( Edison Industrial Systems Ctr. )
Sacha,J.P. ( Edison Industrial Systems Ctr. )
Graff,S. ( Technology Resources Inc. )

掲載資料名:

Machine Vision Applications, Architectures, and Systems Integration VI

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

3205

発行年:

1997

開始ページ:

37

終了ページ:

44

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819426376 [0819426377]

言語:

英語

請求記号:

P63600/3205

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00016932
シリーズID:	PA00000029
会議名:	Intelligent Systems and Advanced Manufacturing : Machine Vision Applications, Architectures, and Systems Integration
回次:	1997 : 6th
会議開催地:	Pittsburgh, PA, USA
会議開催年:	1997.10.15-1997.10.16

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