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Characterization of tungsten silicide(WSix)film grown by chemical vapor deposition(CVD)

著者名:
Hossain,F.R. ( Motorola )
Ambadi,S.
Winer,R.
Kitt,K.
Garcia,C.
Pearse,J.
さらに 1 件
掲載資料名:
Microelectronic Device Technology III
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3881
発行年:
1999
開始ページ:
58
終了ページ:
61
出版情報:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819434784 [0819434787]
言語:
英語
請求記号:
P63600/3881
資料種別:
国際会議録

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