Polarization models for Monte Carlo ray tracing

Polarization models for Monte Carlo ray tracing

著者名:

Freniere,E.R. ( Lambda Research Corp. )
Gregory,G.G.
Hassler,R.A.

掲載資料名:

Optical system design and analysis software : 21-22 July 1999, Denver, Colorado

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

3780

発行年:

1999

開始ページ:

148

終了ページ:

150

出版情報:

Bellingham, Wash.: SPIE: SPIE - The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819432667 [0819432660]

言語:

英語

請求記号:

P63600/3780

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00016685
シリーズID:	PA00000029
会議名:	Optics & Photonics : Optical system design and analysis software
回次:	1999
会議開催地:	Denver, CO, USA
会議開催年:	1999.07.21-1999.07.22

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