Blank Cover Image

Almost temperature-insensitive characteristics in 1.06-ヲフm InGaAs laser diodes with strain-compensating electron-barrier layers

著者名:
掲載資料名:
Testing, packaging, reliability, and applications of semiconductor lasers IV : 28 January 1999, San Jose, California
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3626
発行年:
1999
開始ページ:
106
終了ページ:
114
出版情報:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819430960 [081943096X]
言語:
英語
請求記号:
P63600/3626
資料種別:
国際会議録

類似資料:

Susaki,W., Yaku,H., Hayakawa,T., Fukunaga,T., Asano,H.

SPIE-The International Society for Optical Engineering

Basiev,T.T., Ilichev,N.N., Kiryanov,A.V., Pashinin,P.P., Shpuga,S.M.

SPIE-The International Society for Optical Engineering

Chelny,A.A., Zalevsky,I.D., Bulaev,P.V., Kobyakova,M.Sh.

SPIE-The International Society for Optical Engineering

Dijon,J., Poulingue,M., Hue,J.

SPIE - The International Society for Optical Engineering

Poulingue,M., Dijon,J., Garrec,P., Lyan,P.

SPIE - The International Society for Optical Engineering

Miyazaki,T., Inagaki,K., Karasawa,Y., Yoshida,M.

SPIE-The International Society for Optical Engineering

Itoh,H., Yamamoto,Y., Yamamoto,S., Iwata,M., Nishiyama,E., Matsuda,T., Watanabe,M.

SPIE - The International Society for Optical Engineering

Kitatani, T., Kondow, M., Nakahara, K., Uomi, K., Tanaka, T.

MRS-Materials Research Society

Bostanjoglo,G., Weber,H.

SPIE-The International Society for Optical Engineering

Huo,Y., You,N., He,S., Wei,Z.

SPIE-The International Society for Optical Engineering

Hayakawa,T.

SPIE - The International Society for Optical Engineering

Mazhukin,V.I., Nosov,V.V.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12