Static secondary ion mass spectrometry characterization of nail polish and paint surfaces

Static secondary ion mass spectrometry characterization of nail polish and paint surfaces

著者名:

Gresham,G.L. ( Idaho National Engineering and Environmental Lab. )
Groenewold,G.S.
Bauer,W.F.
Ingram,J.C.
Avci,R.

掲載資料名:

Investigation and Forensic Science Technologies

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

3576

発行年:

1999

開始ページ:

66

終了ページ:

72

出版情報:

Bellingham, Wash.: SPIE - The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819430427 [0819430420]

言語:

英語

請求記号:

P63600/3576

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00016666
シリーズID:	PA00000029
会議名:	Photonics East : Investigation and Forensic Science Technologies
回次:	1998
会議開催地:	Boston, MA, USA
会議開催年:	1998.11.03-1998.11.04

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