Measurement of rutile TiO2 dielectric tensor from 0.148 to 33ｦﾌm using generalized ellipsometry

Measurement of rutile TiO2 dielectric tensor from 0.148 to 33ｦﾌm using generalized ellipsometry

著者名:

Tiwald,T.E. ( J.A.Woollam Co.,Inc. )
Schubert,M.

掲載資料名:

Optical diagnostic methods for inorganic transmissive materials II : 3-4 August 2000, San Diego, USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

4103

発行年:

2000

開始ページ:

19

終了ページ:

29

出版情報:

Bellingham, Wash., USA: SPIE - The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819437488 [0819437484]

言語:

英語

請求記号:

P63600/4103

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00016658
シリーズID:	PA00000029
会議名:	Optics & Photonics : Optical diagnostic methods for inorganic transmissive materials
回次:	2000 : 2nd
会議開催地:	San Diego, CA, USA
会議開催年:	2000.08.03-2000.08.04

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