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MOCVD growth and characterization of (BaxSr1-x)Ti1+yO3+z thin films for high frequency devices

著者名:
Baumann, P. K.
Kaufman, D. Y.
Streiffer, S. K.
Im, J.
Auciello, O.
Erck, R. A.
Giumarra, J.
Zebrowski, J.
Baldo, P.
McCormick, A.
さらに 5 件
掲載資料名:
Materials issues for tunable RF and microwave devices : sympowium held November 30-December 2, 1999, Boston, Massachusetts, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
603
発行年:
2000
開始ページ:
169
出版情報:
Warrendale: MRS-Materials Research Society
ISSN:
02729172
ISBN:
9781558995116 [1558995110]
言語:
英語
請求記号:
M23500/603
資料種別:
国際会議録

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