Damage Response to Irradiation Temperature and Ion Fluence in C+- Irradiated 6H-SiC

Damage Response to Irradiation Temperature and Ion Fluence in C+- Irradiated 6H-SiC

著者名:

掲載資料名:

Microstructural processes in irradiated materials : symposium held November 30-December 2, 1998, Boston, Massachusetts, U.S.A.

シリーズ名:

Materials Research Society symposium proceedings

シリーズ巻号:

540

発行年:

1999

開始ページ:

183

出版情報:

Warrendale, PA: MRS - Materials Research Society

ISSN:

02729172

ISBN:

9781558994461 [1558994467]

言語:

英語

請求記号:

M23500/540

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00016593
シリーズID:	PA00000011
会議名:	Symposium on microstructural processes in irradiated materials
回次:	1998
会議開催地:	Boston, MA, USA
会議開催年:	1998.11.30-1998.12.02

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