The Microstructural Study of Aluminum Nitride Thin Films: Epitaxy on the Two Orientations of Sapphire and Texturing on Si
- 著者名:
- 掲載資料名:
- Gallium nitride and related materials : the First International Symposium on Gallium Nitride and Related Materials held November 27-December 1, 1995, Boston, Massachusetts, U.S.A.
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 395
- 発行年:
- 1996
- 開始ページ:
- 387
- 出版情報:
- Pittsburgh, Pa.: MRS - Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558992986 [1558992987]
- 言語:
- 英語
- 請求記号:
- M23500/395
- 資料種別:
- 国際会議録
類似資料:
MRS - Materials Research Society |
MRS - Materials Research Society |
MRS - Materials Research Society |
8
国際会議録
Microstructural Effects in the Thermochromic Behavior of VO2/Al/Si Thin Film Heterostructures
Materials Research Society |
MRS - Materials Research Society |
MRS - Materials Research Society |
MRS - Materials Research Society |
MRS - Materials Research Society |
MRS - Materials Research Society |
11
国際会議録
Formation of Interfacial Dislocations in Heteroepitaxial Layers Grown in Two-Dimensional Mode
MRS - Materials Research Society |
MRS - Materials Research Society |
SPIE-The International Society for Optical Engineering |