AN HREM STUDY OF THE MICROSTRUCTURE OF Al CONTACT ON GaN/AlN/SiC THIN FILMS
- 著者名:
- 掲載資料名:
- Evolution of thin film and surface structure and morphology : symposium held November 28-December 2, 1994, Boston, Massachusetts, USA
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 355
- 発行年:
- 1995
- 開始ページ:
- 433
- 出版情報:
- Pittsburgh, Pa.: MRS - Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558992566 [1558992561]
- 言語:
- 英語
- 請求記号:
- M23500/355
- 資料種別:
- 国際会議録
類似資料:
MRS - Materials Research Society |
MRS - Materials Research Society |
Materials Research Society |
MRS - Materials Research Society |
Trans Tech Publications |
MRS - Materials Research Society |
MRS - Materials Research Society |
MRS - Materials Research Society |
5
国際会議録
MORPHOLOGY AND INTERFACE CHEMISTRY OF THE INITIAL GROWTH OF GaN AND AIN ON α-SiC AND SAPPHIRE
Materials Research Society |
Materials Research Society |
MRS - Materials Research Society |
MRS - Materials Research Society |