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ATOMIC STRUCTURE OF ULTRATHIN ERBIUM SILICIDES ON Si(111)

著者名:
Lohmeier, M.
Huisman, W. J.
Horst, G. Ter
Zagwijn, P. M.
Nishiyama, A.
Nicklin, C. L.
Turner, T. S.
Vlieg, E.
さらに 3 件
掲載資料名:
Evolution of thin film and surface structure and morphology : symposium held November 28-December 2, 1994, Boston, Massachusetts, USA
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
355
発行年:
1995
開始ページ:
281
出版情報:
Pittsburgh, Pa.: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558992566 [1558992561]
言語:
英語
請求記号:
M23500/355
資料種別:
国際会議録

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