Durability of experimental fused silicas to 193-nm induced compaction
- 著者名:
- Schenker,R.E. ( Univ.of California/Berkeley )
- Piao,F.
- Oldham,W.G.
- 掲載資料名:
- Optical Microlithography X
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 3051
- 発行年:
- 1997
- 開始ページ:
- 44
- 終了ページ:
- 53
- 出版情報:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819424655 [081942465X]
- 言語:
- 英語
- 請求記号:
- P63600/3051
- 資料種別:
- 国際会議録
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