Vibration analysis using linearized fringe analysis and video speckle techniques

Vibration analysis using linearized fringe analysis and video speckle techniques

著者名:

Lokberg,O.J. ( Norwegian Institute of Technology )
Rustad,R.
Valera,J.

掲載資料名:

International Conference on Experimental Mechanics: Advances and Applications, 4-6 December, 1996, Singapore

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

2921

発行年:

1997

開始ページ:

294

終了ページ:

299

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819423238 [0819423238]

言語:

英語

請求記号:

P63600/2921

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00016560
シリーズID:	PA00000029
会議名:	International Conference on Experimental Mechanics
回次:	1996
会議開催地:	Singapore
会議開催年:	1996.12.04-1996.12.06

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1 国際会議録 Recent vibration analysis results at NTNU with video speckle interferometry (Invited Paper) Valera,J.D.R., Lokberg,O.J. SPIE-The International Society for Optical Engineering	7 国際会議録 Large-amplitude point vibration measurement with optical fiber moire'-based technique Valera,J.D.R., Sinha,P.G., Yoshino,T.T., Lnkberg,O.J. SPIE-The International Society for Optical Engineering
2 国際会議録 Reconstruction of sound fields using TV holography O.J. Løkberg, R. Rustad, M. Espeland Society of Photo-optical Instrumentation Engineers	8 国際会議録 Electronic Speckle Pattern Interferometry Lokberg J. O. Martinus Nijhoff Publishers
3 国際会議録 Large-amplitude point-vibration measurement with an optical fibre moirebased technique Valera,J.D.R., Sinha,P.G., Yoshino,T.T., Lokberg,O.J. SPIE-The International Society for Optical Engineering	9 国際会議録 Real-time speckle interferometry fringe analysis system Coggrave,C.R., Huntley,J.M. SPIE - The International Society for Optical Engineering
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5 国際会議録 Video Speckle Interferometry: An Optical Measuring Tool for Industry Lokberg J. O. Kluwer Academic Publishers	11 国際会議録 Absorption measurements using low-coherence interferometry Storen,T., Ostling,D., Svaasand,L.O., Lokberg,O.J., Lindmo,T. SPIE - The International Society for Optical Engineering
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