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In-Depth Characterization of Damage Produced by Swift Heavy Ion Irradiation Using a Tapping Mode Atomic Force Microscope

著者名:
掲載資料名:
Materials science applications of ion beam techniques : proceedings of the International Symposium on Materials Science Applications of Ion Beam Techniques, incoeporating the 1st German-Australian Workshop on Ion Beam Analysis, Seeheim, Germany, September 9-12 1996
シリーズ名:
Materials science forum
シリーズ巻号:
248-249
発行年:
1997
開始ページ:
129
終了ページ:
134
出版情報:
Zuerich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878497676 [0878497676]
言語:
英語
請求記号:
M23650
資料種別:
国際会議録

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