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The Pair-Doped Delta-Superlattice:An Inner Probe to Measure Monolayer Doping Fluctuations in Semiconductors

著者名:
Zehe,A.  
掲載資料名:
Molecular beam epitaxy : proceedings of the Third International Symposium held in Velico Tarnovo, Bulgaria, Oct. 2-7, 1989
シリーズ名:
Materials science forum
シリーズ巻号:
69
発行年:
1991
開始ページ:
139
終了ページ:
150
出版情報:
Zurich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878496143 [0878496149]
言語:
英語
請求記号:
M23650
資料種別:
国際会議録

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