Test, verification & validation issues in modelling a generic electro-optic system

Test, verification & validation issues in modelling a generic electro-optic system

著者名:

Smith, M.I. ( Pilkington Optronics, UK )
Hickman, D.
Murray-Smith, D.J.

掲載資料名:

Infrared technology and applications XXIV : 19-24 July 1998, San Diego, California

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

3436

発行年:

1998

巻:

Part 2

開始ページ:

903

終了ページ:

914

出版情報:

Bellingham, Wash., USA: SPIE

ISSN:

0277786X

ISBN:

9780819428912 [0819428914]

言語:

英語

請求記号:

P63600/3436

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00016480
シリーズID:	PA00000029
会議名:	Optics & Photonics : Infrared technology and applications
回次:	1998 : 24th
会議開催地:	San Diego, CA, USA
会議開催年:	1998.07.19-1998.07.24

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