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Characterization of In doped CdTe grown by molecular beam epitaxy

著者名:
Kang, T.W. ( Dongguk University, Korea )
Leem, J.H.
Hou, Y.B.
Ryu, Y.S.
Lee, H.Y.
Jeon, H.C.
Hyun, J.K.
Kang, C.K.
Kim, T.W.
さらに 4 件
掲載資料名:
Infrared technology and applications XXIV : 19-24 July 1998, San Diego, California
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3436
発行年:
1998
巻:
Part 1
開始ページ:
2
終了ページ:
9
出版情報:
Bellingham, Wash., USA: SPIE
ISSN:
0277786X
ISBN:
9780819428912 [0819428914]
言語:
英語
請求記号:
P63600/3436
資料種別:
国際会議録

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