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Role of growth defects on carrier dynamics: semi-insulating GaAs

著者名:
Mizeikis,V. ( Vilnius Univ.(Lithuania) )
Jarasiunas,K. ( Vilnius Univ.(Lithuania) )
Storasta,J. ( Vilnius Univ.(Lithuania) )
Gudelis.V. ( Vilnius Univ.(Lithuania) )
Bastiene,L. ( Vilnius Univ.(Lithuania) )
Sudzius,M.
さらに 1 件
掲載資料名:
International Conference on Optical Diagnosis of Materials and Devices for Opto-, Micro-, and Quantum Electronics : 13-15 May 1997, Kiev, Ukraine
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3359
発行年:
1998
開始ページ:
163
終了ページ:
170
出版情報:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819428080 [0819428086]
言語:
英語
請求記号:
P63600/3359
資料種別:
国際会議録

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