High-k scaling for gate insulators: an insightful study
- 著者名:
- Krishnan,S. ( Advanced Micro Devices,Inc. )
- Yeap,G.C.-F. ( Advanced Micro Devices,Inc. )
- Yu,B. ( Advanced Micro Devices,Inc. )
- Xiang,Q. ( Advanced Micro Devices,Inc. )
- Lin,M.-R. ( Advanced Micro Devices,Inc. )
- 掲載資料名:
- Microelectronic device technology II : 23-24 September, 1998, Santa Clara, California
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 3506
- 発行年:
- 1998
- 開始ページ:
- 65
- 終了ページ:
- 72
- 出版情報:
- Bellingham, Washington: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819429650 [0819429651]
- 言語:
- 英語
- 請求記号:
- P63600/3506
- 資料種別:
- 国際会議録
類似資料:
SPIE-The International Society for Optical Engineering |
MRS - Materials Research Society |
SPIE-The International Society for Optical Engineering |
Electrochemical Society |
SPIE - The International Society for Optical Engineering |
MRS - Materials Research Society |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
MRS-Materials Research Society |
MRS - Materials Research Society |
Electrochemical Society |
Electrochemical Society |