1.

Conference Proceedings

Conference Proceedings
Hull, R. ; Moore, M. ; Bahnck, D. ; Geva, M. ; Karlicek, R.F., Jr. ; Stevie, F.A. ; Walker, J.F.
Pub. info.: Proceedings of the Symposium on Nondestructive Wafer Characterization for Compound Semiconductor Materials and the twenty-second State-of-the-Art Program on Compound Semiconductors (SOTAPOCS XXII).  pp.23-38,  1995.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 95-6
2.

Conference Proceedings

Conference Proceedings
Stevie, F.A. ; Persson, E. ; DeBusk, D.K. ; Savchuk, A. ; Hoff, A.M. ; Edelman, P. ; Lagowski, J.
Pub. info.: Proceedings of the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices.  pp.357-364,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-12
3.

Conference Proceedings

Conference Proceedings
Muller, A.J. ; Psota-Kelty, L.A. ; Krautter, H.W. ; Sinclair, J.D. ; Stevie, F.A. ; Martin, E.P. ; Kahora, P.M. ; Nanda, A.K.
Pub. info.: Proceedings of the Symposium on Contamination Control and Defect Reduction in Semiconductor Manufacturing II.  pp.143-156,  1994.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1994-3