1.

Conference Proceedings

Conference Proceedings
Osip, D. J. ; Phillips, M. M. ; Bernstein, R. ; Burley, G. ; Dressler, A. ; Elliot, J. L. ; Persson, E. ; Shectman, S. A. ; Thompson, I.
Pub. info.: Ground-based instrumentation for astronomy : 21-25 June 2004, Glasgow, Scotland, United Kingdom.  pp.49-59,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5492
2.

Conference Proceedings

Conference Proceedings
Stevie, F.A. ; Persson, E. ; DeBusk, D.K. ; Savchuk, A. ; Hoff, A.M. ; Edelman, P. ; Lagowski, J.
Pub. info.: Proceedings of the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices.  pp.357-364,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-12
3.

Conference Proceedings

Conference Proceedings
Jastrzebski, L. ; Henley, W. ; DeBusk, D. ; Haddad, N. ; Lowell, J. ; Wenner, V. ; Nauka, K. ; Persson, E.
Pub. info.: Proceedings of the Third International Symposium on Cleaning Technology in Semiconductor Device Manufacturing.  pp.530-536,  1994.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1994-7
4.

Conference Proceedings

Conference Proceedings
Edelman, P. ; Lagowski, J. ; Savchouk, A. ; Hoff, A. ; Jastrzebski, L. ; Persson, E.
Pub. info.: Materials reliability in microelectronics VI : symposium held April 8-12, 1996, San Francisco, California, U.S.A..  pp.443-,  1996.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 428