Sensitivity analysis of a photonic crystal structure for index-of-refraction sensing
- Author(s):
O. Levi ( Stanford Univ. (USA) ) M. M. Lee ( Stanford Univ. (USA) ) J. Zhang ( Ctr. for High Technology Materials, Univ. of New Mexico (USA) ) V. Lousse ( Stanford Univ. (USA) ) S. R. J. Brueck ( Ctr. for High Technology Materials, Univ. of New Mexico (USA) ) S. Fan ( Stanford Univ. (USA) ) J. S. Harris ( Stanford Univ. (USA) ) - Publication title:
- Nanoscale imaging, spectroscopy, sensing, and actuation for biomedical applications IV : 23-24 January 2007, San Jose, California, USA
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 6447
- Pub. Year:
- 2007
- Paper no.:
- 64470P
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 16057422
- ISBN:
- 9780819465603 [0819465607]
- Language:
- English
- Call no.:
- P63600/6447
- Type:
- Conference Proceedings
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