Blank Cover Image

Preparation of superconducting nanometer structures by means of scanning tunneling microscopy and of layer-by-layer MBE

Author(s):
Buschmann,L. ( RWTH Aachen )
Hoffschulz,H.
Dressen,J.
Stahl,H.
Decker,B.
Nouvertne,F.
Barth,R.
Spangenberg,B.
Kurz,H.
Guntherodt,G.
5 more
Publication title:
Oxide superconductor physics and nano-engineering II : 30 January -2 February 1996, San Jose, California
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
2697
Pub. Year:
1996
Page(from):
350
Page(to):
360
Pub. info.:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819420718 [0819420719]
Language:
English
Call no.:
P63600/2697
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Forces in Scanning Probe Microscopy

Meyer E., Hug J. H., Luthi R., Stiefel B., Guntherodt -J. H.

Kluwer Academic Publishers

Bunker, B.C., Voigt, J.A., Lamppa, D.L., Doughty, D.H., Venturini, E.L., Kwak, J.F., Ginley, D.S., Headley, T.J., …

Materials Research Society

Scharnholz, S., Hellmund, O., Stein, J., Spangenberg, B., Kurz, H.

Trans Tech Publications

Probst O., Dey S., Fritz J., Grafstrom S., Hagen T., Kowalski J., zu Putlitz G., Neumann R.

Kluwer Academic Publishers

Zheng, J. F., Salmeron, M. B., Weber, E. R.

MRS - Materials Research Society

Zheng,J.-F., Liu,X., Newman,N., Weber,E.R.

Trans Tech Publications

4 Conference Proceedings Friction Force Microscopy

Meyer E., Luthi R., Howald L., Guntherodt -J. H.

Kluwer Academic Publishers

Maboudian, R., Bressler-Hill, V., Wang, X.-S., Pond, K., Petroff, P.M., Weinberg, W.H.

Materials Research Society

Wiesendanger, R., Tarrach, G., Buergler, D., Scandella, L., Guentherodt, H. -J.

Materials Research Society

Johnson, M. B., Pfister, M., Alvarado, S. F., Salemink, H. W. M.

MRS - Materials Research Society

Baumgart, P., Hillebrands, B., Harzer, J.V., Guntherodt, G.

Materials Research Society

M. Bleichert, H. S. Eckhardt, K.-F. Klein, B. Spangenberg, G. Hillrichs, J. Mannhardt

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12