Blank Cover Image

Comparison of Single Event Upset Effects on the Clementine and Cassini Solid State Data Recorders - A Study in Data Mining

Author(s):
Publication title:
AIAA meeting papers on disc
Title of ser.:
AIAA Paper : Aerospace Sciences Meeting and Exhibit
Ser. no.:
2009
Pub. Year:
2009
No.:
2009-0118
Paper no.:
AIAA Paper 2009-0118
Pub. info.:
Reston, Va.: American Institute of Aeronautics and Astronautics
ISSN:
10877215
Language:
English
Call no.:
A07400/200901
Type:
Technical Paper

Similar Items:

Takubo, N., Ishikawa, H., Kato, K., Okuno, T., Oga, R.

Society of Automotive Engineers

Lundquist,J.M., Andrieux,M.L., Dinkespiler,B., Evans,G.A., Ganllin-Martel,L., Pearce,M., Rethore,F., Stroynowski,R., …

SPIE-The International Society for Optical Engineering

Yerazunis, W. S., Leigh, D. L., Freeman, W. T., Bardsley, R. S.

Society of Automotive Engineers

Kim, Q., Schwartz, H., McCarty, K., Coss, J., Barnes, C.

National Aeronautics and Space Adminstration

Fay, R., Robinette, R., Deering, D., Scott, J.

Society of Automotive Engineers

Gabler, H.C., Hampton, C.E., Hinch, J.

Society of Automotive Engineers

Lowe, Calvin W. et al.

National Aeronautics and Space Administration

Ruth, R.R., West, O., Nasrallah, H.

Society of Automotive Engineers

venable, D. D. et al.

National Aeronautics and Space Administration

Ruth, R., Daily, J.

Society of Automotive Engineers

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12