Efficient Testing and Cost Awareness: Low-Cost Versus HIL-System.

Efficient Testing and Cost Awareness: Low-Cost Versus HIL-System.

Author(s):

Publication title:

2012 SAE world congress : technical paper

Title of ser.:

Society of Automotive Engineers technical paper series

Ser. no.:

2012

Pub. Year:

2012

No.:

2012-01-0933

Paper no.:

2012-01-0933

Pages:

9

Pub. info.:

Warrendale, Penn.: Society of Automotive Engineers

ISSN:

01487191

Language:

English

Call no.:

S10400

Type:

Technical Paper

Details

TDL ID:	ZA00052142
Series ID:	PA00000058
Conf. info. (Name):	SAE 2012 World Congress
Conf. info. (Number):	2012
Conf. info. (Venue):	Detroit, Michigan, USA
Conf. info. (Date):	2012.04.24-2012.04.26
Note for article:	SAE 2012 World Congress, April 24-26, 2012, Detroit, Michigan, USA

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