Photogrammetric Recession Measurement of Ablative Materials During Arc-Jet Testing

Photogrammetric Recession Measurement of Ablative Materials During Arc-Jet Testing

Author(s):

E. Schairer ( NASA Ames Research Center, Moffett Field, CA )
J. Heineck

Publication title:

AIAA meeting papers on disc

Title of ser.:

AIAA Paper : Aerospace Sciences Meeting and Exhibit

Ser. no.:

2007

Pub. Year:

2007

No.:

2007-1158

Paper no.:

AIAA Paper 2007-1158

Pub. info.:

Reston, Va.: American Institute of Aeronautics and Astronautics

ISSN:

10877215

Language:

English

Call no.:

A07400/200703 [CD-ROM 2007 Disc 3]

Type:

Technical Paper

Details

TDL ID:	ZA00050742
Series ID:	PA00000138
Conf. info. (Name):	AIAA Aerospace Sciences Meeting and Exhibit
Conf. info. (Number):	45th
Conf. info. (Venue):	Reno, Nevada
Conf. info. (Date):	2007.01.08-2007.01.11

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