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In-Situ Imaging of Crack Growth with Piezoelectric Wafer Active Sensors

Author(s):
Publication title:
AIAA meeting papers on disc
Title of ser.:
AIAA Paper : AIAA/ASME/ASCE/AHS/ASC Structures, Structural Dynamics, and Materials Conference
Ser. no.:
2006
Pub. Year:
2006
No.:
2006-2114
Paper no.:
AIAA Paper 2006-2114
Pub. info.:
[Reston, Va.]: American Institute of Aeronautics and Astronautics
ISSN:
10877215
Language:
English
Call no.:
A07400/200607 [CD-ROM 2006 Disc 7]
Type:
Technical Paper

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